Item type |
学術雑誌論文 / Journal Article(1) |
公開日 |
2015-09-08 |
タイトル |
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タイトル |
Transmission Imaging and Strain Mapping in the Vicinity of Internal Crack Tip Using Synchrotron White X-Ray |
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言語 |
en |
言語 |
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言語 |
eng |
キーワード |
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主題Scheme |
Other |
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主題 |
Synchrotron radiation |
キーワード |
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主題Scheme |
Other |
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主題 |
High energy white X-ray |
キーワード |
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主題Scheme |
Other |
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主題 |
Fatigue crack |
キーワード |
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主題Scheme |
Other |
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主題 |
Internal strain |
キーワード |
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主題Scheme |
Other |
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主題 |
Energy dispersive method |
キーワード |
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主題Scheme |
Other |
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主題 |
Nondestructive evaluation |
資源タイプ |
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資源 |
http://purl.org/coar/resource_type/c_6501 |
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タイプ |
journal article |
アクセス権 |
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アクセス権 |
open access |
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アクセス権URI |
http://purl.org/coar/access_right/c_abf2 |
著者 |
SHIBANO, Jun-ichi
KAJIWARA, Kentaro
KIRIYAMA, Koji
SHOBU, Takahisa
SUZUKI, Kenji
NISHIMURA, Suguru
MIURA, Setsuo
KOBAYASHI, Michiaki
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著者別名 |
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識別子Scheme |
WEKO |
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識別子 |
44813 |
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識別子Scheme |
KAKEN |
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識別子URI |
https://nrid.nii.ac.jp/ja/nrid/1000060206141 |
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識別子 |
60206141 |
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姓名 |
柴野, 純一 |
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言語 |
ja |
著者別名 |
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識別子Scheme |
WEKO |
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識別子 |
41361 |
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姓名 |
三浦, 節男 |
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言語 |
ja |
著者別名 |
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識別子Scheme |
WEKO |
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識別子 |
41362 |
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姓名 |
小林, 道明 |
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言語 |
ja |
抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
A transmission imaging and a strain mapping in the vicinity of a crack tip in steel were investigated using a high energy white X-ray obtained from BL28B2 beam line at SPring-8 in Japan. Low-alloy and high-tensile steel was used as a specimen prepared in the G-type geometry with a rectangular sectional part of 5mm thickness for a four-point bending. A fatigue crack was introduced into the notch root on the tension side of the specimen by a pulsating bending load. The imaging of the crack in the specimen under the bending load was carried out by using the CCD camera that can detect indirectly the X-ray transmitted through the specimen. To measure the internal strain in the vicinity of the crack tip, the synchrotron white X-ray beam, which had a height of 80?m and a width of 300?m, was incident on the specimen with the Bragg angle ? of 5 degrees using the energy dispersive X-ray diffraction technique. As the results, the transmitted image of the crack showed that the crack in the specimen was propagated deeper than that on the surface. The map of the internal strain near the crack tip could be obtained using the white X-ray with energy ranging from 50keV to 150keV. It became clear by the numerical simulation that the FWHM of diffracted X-ray profile measured near the crack tip was increased due to the steep change in the strain distribution. It was confirmed that the synchrotron white X-ray was useful for the imaging of the internal crack and the strain mapping near it. |
書誌情報 |
Materials Science Forum
巻 638-642,
p. 2476-2481,
発行日 2010-01
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DOI |
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識別子タイプ |
DOI |
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関連識別子 |
http://doi.org/10.4028/www.scientific.net/MSF.638-642.2476 |
出版者 |
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出版者 |
Trans Tech Publications |
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言語 |
en |
関連サイト |
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URL |
http://www.ttp.net/0255-5476.html |
著者版フラグ |
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言語 |
en |
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値 |
author |
出版タイプ |
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出版タイプ |
AM |
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出版タイプResource |
http://purl.org/coar/version/c_ab4af688f83e57aa |