{"created":"2021-03-01T06:01:10.037028+00:00","id":8845,"links":{},"metadata":{"_buckets":{"deposit":"21f7e66d-39ef-4e7d-8095-56c4d12bccd1"},"_deposit":{"id":"8845","owner":"1","owners":[],"pid":{"revision_id":0,"type":"depid","value":"8845"},"status":"published"},"_oai":{"id":"oai:kitami-it.repo.nii.ac.jp:00008845","sets":["82:90"]},"author_link":["90261"],"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-03-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageEnd":"32","bibliographicPageStart":"1","bibliographic_titles":[{"bibliographic_title":"北見工業大学　機器分析センター年報","bibliographic_titleLang":"ja"}]}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"◆ 巻頭言　機器分析センター長　吉田 孝\n◆ 研究紹介　その場処理を利用したXPS分析による表面反応の精密解析　1\n機器分析センター　大津 直史\n◆ 共同利用機器の紹介　MALDI-TOF-MS　6\nバイオ環境化学科　多田 清志\n◆ 利用実績\n平成20年度　走査型電子顕微鏡を用いて得られた成果一覧　8\n平成20年度　核磁気共鳴分光装置を用いて得られた成果一覧　13\n平成20年度　X線回析装置および蛍光X線分析装置を用いて得られた成果一覧　17\n平成20年度　ガスクロマトグラフ質量分析装置及びイオンクロマトグラフ装置を用いて得られた成果一覧　23\n平成20年度　原子吸光分析装置及び誘導結合プラズマ原子発行分析装置を用いて得られた成果一覧　26\n平成20年度　透過型電子顕微鏡を用いて得られた成果一覧　29\n平成20年度　デジタルハイスピードカメラ及び画像処理装置を用いて得られた成果一覧　30\n◆ 設置機器類　31\n◆ 編集後記　32","subitem_description_language":"ja","subitem_description_type":"TableOfContents"}]},"item_8_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.19000/00008845","subitem_identifier_reg_type":"JaLC"}]},"item_8_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"北見工業大学","subitem_publisher_language":"ja"}]},"item_8_relation_41":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_link_language":"ja","subitem_link_text":"共用設備センター（機器分析センター）年報一覧","subitem_link_url":"http://www.iac.kitami-it.ac.jp/Annual_report.html"}]},"item_8_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"北見工業大学, 機器分析センター","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"90261","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-12-11"}],"displaytype":"detail","filename":"kikibunsekinenpo_7.pdf","filesize":[{"value":"3.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kikibunsekinenpo_7","objectType":"fulltext","url":"https://kitami-it.repo.nii.ac.jp/record/8845/files/kikibunsekinenpo_7.pdf"},"version_id":"38a58515-b8bf-4ed5-a05e-71ddd736b3de"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"other","resourceuri":"http://purl.org/coar/resource_type/c_1843"}]},"item_title":"北見工業大学　機器分析センター年報　第7号","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"北見工業大学　機器分析センター年報　第7号","subitem_title_language":"ja"},{"subitem_title":"Annual Report of Instrumental Analysis Center Kitami Institute of Technology Vol.7","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["90"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2019-12-11"},"publish_date":"2019-12-11","publish_status":"0","recid":"8845","relation_version_is_last":true,"title":["北見工業大学　機器分析センター年報　第7号"],"weko_creator_id":"1","weko_shared_id":3},"updated":"2022-12-13T02:24:47.155320+00:00"}