{"created":"2021-03-01T06:00:32.887972+00:00","id":8088,"links":{},"metadata":{"_buckets":{"deposit":"5e4f3676-2974-4ac3-a1e9-e2b325da963c"},"_deposit":{"created_by":188,"id":"8088","owners":[188],"pid":{"revision_id":0,"type":"depid","value":"8088"},"status":"published"},"_oai":{"id":"oai:kitami-it.repo.nii.ac.jp:00008088","sets":["1:87"]},"author_link":["1621927282136","43313","42177"],"control_number":"8088","item_1646810750418":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_3_biblio_info_186":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"80","bibliographicPageStart":"76","bibliographicVolumeNumber":"E99.C","bibliographic_titles":[{"bibliographic_title":"IEICE Trans. Electron"}]}]},"item_3_description_184":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We propose an algorithm for the scattering analyses of gratings with various local defects based on the difference-field boundary-element method (DFBEM). In the algorithm, the defect in the grating is partitioned, and the DFBEM is sequentially applied for each defect section. We validate the proposed algorithm by demonstrating its flexibility for various defect topologies for a locally deformed grating.","subitem_description_type":"Abstract"}]},"item_3_link_221":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_link_url":"http://search.ieice.org/index.html"}]},"item_3_publisher_212":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Institute of Electronics, Information and Communication Engineers(電子情報通信学会)"}]},"item_3_relation_191":{"attribute_name":"item_3_relation_191","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://doi.org/10.1587/transele.E99.C.76","subitem_relation_type_select":"DOI"}}]},"item_3_rights_192":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyrightc2016 IEICE"}]},"item_3_select_195":{"attribute_name":"item_3_select_195","attribute_value_mlt":[{"subitem_select_item":"publisher","subitem_select_language":"en"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"SUGISAKA, Jun-ichiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"43313","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"YASUI, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1621927282136","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HIRAYAMA, Koichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"42177","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-11-22"}],"displaytype":"detail","filename":"IEICETrans.Electron_E99-C_76.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"label":"IEICETrans.Electron_E99-C_76.pdf","url":"https://kitami-it.repo.nii.ac.jp/record/8088/files/IEICETrans.Electron_E99-C_76.pdf"},"version_id":"cc588b2d-9b76-43ab-81c9-ef47ba5aeb1c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"diffraction grating","subitem_subject_scheme":"Other"},{"subitem_subject":"boundary-element method","subitem_subject_scheme":"Other"},{"subitem_subject":"defect","subitem_subject_scheme":"Other"},{"subitem_subject":"scattering","subitem_subject_scheme":"Other"},{"subitem_subject":"numerical analysis","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Efficient Scattering Analysis of Arbitrarily Shaped Local Defect in Diffraction Grating","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Efficient Scattering Analysis of Arbitrarily Shaped Local Defect in Diffraction Grating","subitem_title_language":"en"}]},"item_type_id":"3","owner":"188","path":["87"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-03-01"},"publish_date":"2016-03-01","publish_status":"0","recid":"8088","relation_version_is_last":true,"title":["Efficient Scattering Analysis of Arbitrarily Shaped Local Defect in Diffraction Grating"],"weko_creator_id":"188","weko_shared_id":-1},"updated":"2025-12-12T03:18:58.220746+00:00"}