{"created":"2021-03-01T05:59:43.150504+00:00","id":7267,"links":{},"metadata":{"_buckets":{"deposit":"5cf721a3-8306-4796-b550-f7385ac97cd8"},"_deposit":{"id":"7267","owners":[],"pid":{"revision_id":0,"type":"depid","value":"7267"},"status":"published"},"_oai":{"id":"oai:kitami-it.repo.nii.ac.jp:00007267","sets":["1:87"]},"author_link":["37255","37256","37257","37258","37259","37260"],"item_1646810750418":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_3_biblio_info_186":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"1228","bibliographicPageStart":"1225","bibliographicVolumeNumber":"324-325","bibliographic_titles":[{"bibliographic_title":"Key Engineering Materials"}]}]},"item_3_description_184":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The strain in the bulk of material was evaluated using high energy white X-rays from a synchrotron radiation source of SPring-8 in Japan. An austenitic stainless steel (JIS-SUS304L) was used for a specimen. The specimen of 5 mm thickness was subjected to the bending. The internal strain of it could be measured using white X-rays which range of energy from 60 keV to 125 keV. The measurement of the internal strain with a high accuracy was accomplished using the strain data from several lattice planes of i?§-Fe simultaneously. Furthermore, the measurement error of strain could be decreased by using the iffracted beam with high energy, high peak count and the similar profile with the Gaussian distribution. The results showed that the high energy white X-rays is effective for the internal strain measurement in the depth of the order of millimeter.","subitem_description_type":"Abstract"}]},"item_3_description_185":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"(c)1995-2008 by Trans Tech Publications Inc.","subitem_description_type":"Other"}]},"item_3_description_194":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_publisher_212":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Trans Tech Publications"}]},"item_3_select_195":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hirata, Tomoyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shibano, Jun-ichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shobu, Takahisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Suzuki, Kenji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kaneko, Hiroshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Michiaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-11-22"}],"displaytype":"detail","filename":"kem324-325_1225-1228.pdf","filesize":[{"value":"855.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kem324-325_1225-1228.pdf","url":"https://kitami-it.repo.nii.ac.jp/record/7267/files/kem324-325_1225-1228.pdf"},"version_id":"1f9f1811-7b7a-4f83-b6d1-f5bf0616ca28"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"High energy white X-rays","subitem_subject_scheme":"Other"},{"subitem_subject":"Synchrotron radiation","subitem_subject_scheme":"Other"},{"subitem_subject":"Energy dispersive method","subitem_subject_scheme":"Other"},{"subitem_subject":"Internal strain","subitem_subject_scheme":"Other"},{"subitem_subject":"Nondestructive evaluation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Strain Measurement in the Depth of the Order of Millimeter Using High Energy White X-rays","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Strain Measurement in the Depth of the Order of Millimeter Using High Energy White X-rays","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["87"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-02-20"},"publish_date":"2008-02-20","publish_status":"0","recid":"7267","relation_version_is_last":true,"title":["Strain Measurement in the Depth of the Order of Millimeter Using High Energy White X-rays"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2022-12-13T02:20:42.778478+00:00"}