2024-03-28T17:17:26Z
https://kitami-it.repo.nii.ac.jp/oai
oai:kitami-it.repo.nii.ac.jp:00006973
2022-12-13T02:24:11Z
1
Spectroscopic ellipsometry of TaN_x and VN films
J., Mistrik
K., Takahashi
R., Antos
M., Aoyama
T., Yamaguchi
Y., Anma
Y., Fukuda
M., B. Takeyama
A., Noya
Z.-T., Jiang
S., M. Thurgate
G., V. Riessen
metadata only access
Elsevier
2004-05
eng
journal article
https://kitami-it.repo.nii.ac.jp/records/6973
455-456
473
477